National Instruments presents Automated Test Summit 2010


National Instruments invites you for the Seminar on Automated Test Summit 2010 being held on 16th April.

Watch LIVE Demonstrations and See for yourself as how you can work Faster, Better at Low Costs.

In this Seminar, you will learn:

To integrate Cost-Effective, High-performance NI Modular Instruments and Adaptable Software into your application while reusing your current investments.

To speed up the Design and Test cycle for your Test application by leveraging the same development program from Design to Manufacturing.

Attend LIVE Demonstrations showcasing Customized-Test-Systems for latest A/V, Digital, IF, RF, Wireless Technologies, DVDs, Portable audio devices, IC and Board tests and more

- RF Signal Test

- Board level Test

Who would benefit from attending this seminar?

This seminar is designed for Key Decision Makers, Design and Test Engineers and Managers, Scientists and Technicians involved in the cycle of various stages in Product Development, Design, Test, Validation, Verification and Sustenance for Communications test, Consumer Electronics, Semiconductors Devices(IC/Board level) or Sub-assemblies.

Date: Friday, 16th April 2010 Time: 2:00PM - 6:00 PM

Venue: The Taj West End, Race Course Road, Bangalore 560001


Consumer Electronics Test

Leverage the Modular hardware and integrated adaptable software to overcome challenges of Product Development time and cost Learn how to Design more functionality ranging from high-fidelity audio, high-definition video, and wireless capabilities with Least Product development time and low cost!


- Audio Test

- Video Test

Semiconductor Test

Characterize your designs faster, without rewriting the test bench for every new design iteration Learn about software strategies and modular instrumentation hardware for testing DC, audio, video, digital, and RF technologies


- Protocol Aware Testing


- Verification & Validation

Communications Test

Explore the core technologies to overcome Communications Device Design and Test challenges Essential technologies for Base band, IF, and RF parametric test for surrounding device peripherals including video, audio and digital I/O


- Software Defined Radio

- RF & Wireless Test


Tel:080 41190000/ Fax :080 41190010

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