Agilent Technologies Inc. (NYSE: A) today introduced the industry’s fastest logic analyzer. The new instrument combines an industry-leading state capture speed of 4 Gb/s on 68 channels and 2.5 Gb/s on 136 channels with the ability to reliably capture data on the industry’s smallest eye openings, as small as 100 ps by 100 mV. These capabilities allow engineers to measure the increasingly fast digital signals used in emerging technologies and validate and troubleshoot their designs with confidence.
The Agilent U4154A AXIe-based logic analyzer module and associated probes and powerful analysis software provide essential capabilities for engineers working with DDR (double data rate) memory systems, high-speed application-specific integrated chips, analog-to-digital converters and field-programmable gate arrays operating at speeds up to 4 Gb/s.
Timing zoom provides simultaneous state and timing measurements with 80 ps timing resolution and 256 K-sample memory depth, which gives designers more insight into problems by allowing simultaneous state and high-resolution timing measurements over a 20-us time span. The industry’s highest trigger sequencer speed (2.5 Gb/s) gives engineers the ability to trigger reliably on sequential events on DDR memory and other high-speed signals without having to give up triggering flexibility.
“The need for reliable measurements and deep analysis has reached a critical juncture as engineers who focus on high-performance servers and embedded systems begin work on DDR3 2133 systems,” said Perry Keller, Agilent’s representative on the JEDEC DDR committee. “These capabilities will become more critical in the near future as DDR memory speeds continue to increase. The U4154A logic analyzer is the ideal tool for DDR memory measurement and debug work.”
At high speeds, signal integrity validation becomes critical for reliable performance. Validating signal integrity on all channels of a DDR system with an oscilloscope can be very time consuming. The exclusive eye-scan capability of the U4154A allows a quick overview of signal integrity on all signals of a DDR system in a fraction of the time it takes using alternative methods.
Software and probes for the U4154A logic analyzer help engineers complete their tasks.
The U4154A logic analyzer module is compatible with Agilent’s M9502A two-slot AXIe chassis. Multiple modules can be combined on a single time base and trigger sequencer. Multiple modular systems, including Agilent 16900 series frames, can be combined for time-correlated measurements on multiple buses in a system.
“By introducing the industry’s fastest logic analyzer, we are helping our customers continue to innovate as digital bus speeds increase,” said Ross Nelson, general manager of Agilent’s Digital Debug Solutions product line. “This new module delivers on the AXIe standard’s promise to enable unprecedented performance in an open, modular form factor. This introduction highlights Agilent’s commitment to growing its AXIe solutions portfolio, to enable measurement in several domains, such as high-speed logic and protocols.”
The U4154A will be featured at the Synopsis Users Group Conference March 28-30, 2011, and at the Intel Developer Forum in Beijing starting April 12.
Additional information on the Agilent U4154A logic analyzer is available at www.agilent.com/find/U4154A. Product images are available at www.agilent.com/find/U4154A_images. A backgrounder on Semiconductor Memory Markets, Standards and Test Equipment is available at www.agilent.com/find/memory_backgrounder
Information on the company’s complete line of logic analyzers is available at www.agilent.com/find/logic. Information on Agilent’s modular products and systems is available at www.agilent.com/find/modular
Information on compatible probes made by Agilent channel partners is available on these websites:
U.S. Pricing and Availability
The new Agilent U4154A logic analyzers can be ordered today with a starting price of $115,500 for 136 channels, including chassis and probe cables, not including probes. Shipments will begin in April.
AXIe is a standard based on AdvancedTCA technology with extensions for instrumentation and test. The mission of the AXIe Consortium is to provide an open standard that creates a robust ecosystem of components, products and systems for general-purpose instrumentation and semiconductor test. AXIe leverages existing standards from PXI, LXI and IVI. AXIe promises high scalability and performance that will address a range of platforms, including benchtop measurements, rack-and-stack modular and ATE systems. Additional details are available at www.axiestandard.org.